Double particle resolution in semiconductor drift detectors

Nuclear Inst. and Methods in Physics Research, A

Volumn 274, Issue 3, 1989, Pages 469-476

  Gatti, Emilio ^a   Rehak, Pavel ^b   Sampietro, Marco ^a  

^a POLITECNICO DI MILANO   (Italy)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION; PHYSICS--HIGH ENERGY;

COVARIANCE MATRIX; SEMICONDUCTOR DRIFT DETECTOR; SILICON DRIFT CHAMBER;

SEMICONDUCTOR COUNTERS;

EID: 0024304171     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(89)90177-0     Document Type: Article

References (11)