Ultrafast x-ray diffraction using a streak-camera detector in averaging mode

Optics Letters

Volumn 22, Issue 13, 1997, Pages 1012-1014

  Larsson, J ^a   Chang, Z ^a   Judd, E ^a   Schuck, P J ^a   Falcone, R W ^a   Heimann, P A ^b   Padmore, H A ^b   Kapteyn, H C ^c   Bucksbaum, P H ^c   Murnane, M M ^c   Lee, R W ^d   Machacek, A ^e   Wark, J S ^e   Liu, X ^f   Shan, B ^f  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e UNIVERSITY OF OXFORD   (United Kingdom)

^f XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001576597     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.22.001012     Document Type: Article

References (9)

1. D. Bourgeois, T. Ursby, M. Wulff, C. Pradervand, A. Legrand, W. Schildkamp, S. Labouré, V. Šrajer, T. Y. Teng, M. Roth, and K. Moffat, J. Synchrotron Rad. 3, 65 (1996); V. Srajer, T.-Y. Teng, T. Ursby, C. Pradervand, Z. Ren, S.-I. Adachi, W. Schildkamp, D. Bourgeois, M. Wulff, and K. Moffat, Science 274, 1726 (1996).
2. D. Bourgeois, T. Ursby, M. Wulff, C. Pradervand, A. Legrand, W. Schildkamp, S. Labouré, V. Šrajer, T. Y. Teng, M. Roth, and K. Moffat, J. Synchrotron Rad. 3, 65 (1996); V. Srajer, T.-Y. Teng, T. Ursby, C. Pradervand, Z. Ren, S.-I. Adachi, W. Schildkamp, D. Bourgeois, M. Wulff, and K. Moffat, Science 274, 1726 (1996).
3. Z. Chang, A. Rundquist, J. Zhou, M. M. Murnane, H. C. Kapteyn, X. Liu, B. Shan, J. Liu, L. Niu, M. Gong, and X. Zhang, Appl. Phys. Lett. 69, 133 (1996).
4. R. W. Schoenlein, W. P. Leemans, A. H. Chin, P. Volfbeyn, T. E. Glover, P. Balling, M. Zolotorev, K.-J. Kim, S. Chattopadhyay, and C. V. Shank, Science 274, 236 (1996).
5. W. Knox and G. Mourou, Appl. Phys. Lett. 36, 623 (1980); R. Yen, M. M. Downey, C. V. Shank, and D. H. Auston, Appl. Phys. Lett. 44, 718 (1984); A. Maksimchuk, M. Kim, J. Workman, G. Korn, J. Squier, D. Du, D. Umstadter, and M. Bouvier, Rev. Sci. Instrum. 67, 697 (1996).
6. W. Knox and G. Mourou, Appl. Phys. Lett. 36, 623 (1980); R. Yen, M. M. Downey, C. V. Shank, and D. H. Auston, Appl. Phys. Lett. 44, 718 (1984); A. Maksimchuk, M. Kim, J. Workman, G. Korn, J. Squier, D. Du, D. Umstadter, and M. Bouvier, Rev. Sci. Instrum. 67, 697 (1996).
7. W. Knox and G. Mourou, Appl. Phys. Lett. 36, 623 (1980); R. Yen, M. M. Downey, C. V. Shank, and D. H. Auston, Appl. Phys. Lett. 44, 718 (1984); A. Maksimchuk, M. Kim, J. Workman, G. Korn, J. Squier, D. Du, D. Umstadter, and M. Bouvier, Rev. Sci. Instrum. 67, 697 (1996).
8. Z. Chang, A. Rundquist, H. Wang, H. C. Kapteyn, M. Murnane, X. Liu, B. Shan, J. Liu, L. Niu, M. Gong, X. Zhang, and R. Lee, "Demonstration of a 0.54 picosecond x-ray streak camera," Proc. SPIE (to be published).
9. R. Keller, T. Renner, and D. J. Mussiletti, presented at the Seventh Beam Instrumentation Workshop, Argonne, Ill., May 6-9, 1996.