Epitaxial clusters studied by synchrotron X-ray diffraction and scanning tunneling microscopy

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 1-8

  Nielsen, M ^a   Feidenhans'l, R ^a   Berg Rasmussen, F ^a   Baker, J ^a   Falkenberg, G ^b   Lottermoser, L ^b   Johnson, R L ^b   Steinfort, A J ^c   Scholte, P M L ^c  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF HAMBURG   (Germany)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Nanoclusters; STM; X ray diffraction

Indexed keywords

ADSORPTION; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FREE ENERGY; INTERFACIAL ENERGY; LATTICE CONSTANTS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; X RAY CRYSTALLOGRAPHY;

ADSORBATES; HETEROEPITAXIAL GROWTH;

NANOSTRUCTURED MATERIALS;

EID: 0032092404     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00193-8     Document Type: Article

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