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Volumn 352-354, Issue , 1996, Pages 425-429

Structure and phases of In on Ge(001)

Author keywords

Faceting; Germanium; Growth; Indium; Low energy electron diffraction (LEED); Low index single crystal surfaces; Scanning tunnelling microscopy; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING INDIUM; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACES;

EID: 0030148665     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01174-9     Document Type: Article
Times cited : (13)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.