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Volumn 352-354, Issue , 1996, Pages 425-429
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Structure and phases of In on Ge(001)
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Author keywords
Faceting; Germanium; Growth; Indium; Low energy electron diffraction (LEED); Low index single crystal surfaces; Scanning tunnelling microscopy; Surface structure, morphology, roughness, and topography
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Indexed keywords
ANNEALING;
LOW ENERGY ELECTRON DIFFRACTION;
MORPHOLOGY;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTING INDIUM;
SEMICONDUCTOR GROWTH;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
SURFACES;
FACETING;
SURFACE RECONSTRUCTION;
TOPOGRAPHY;
TWO DIMENSIONAL PHASES;
SURFACE STRUCTURE;
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EID: 0030148665
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/0039-6028(95)01174-9 Document Type: Article |
Times cited : (13)
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References (11)
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