Hut clusters on Ge(001) surfaces studied by STM and synchrotron X-ray diffraction

Surface Science

Volumn 352-354, Issue , 1996, Pages 430-434

  Nielsen, M ^a   Smilgies, D M ^a   Feidenhans'l, R ^a   Landemark, E ^a   Falkenberg, G ^b   Lottermoser, L ^b   Seehofer, L ^b   Johnson, R L ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Germanium; Indium; Scanning tunnelling microscopy; Stepped single crystal surfaces; Surface structure, morphology, roughness, and topography

Indexed keywords

ANNEALING; CHEMICAL BONDS; INDIUM; MODELS; MONOLAYERS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GERMANIUM; SINGLE CRYSTALS; SURFACE ROUGHNESS; SURFACES; X RAY DIFFRACTION;

HUT CLUSTERS; STRUCTURAL MODEL; SYNCHROTRON X RAY DIFFRACTION; TOPOGRAPHY;

SURFACE STRUCTURE;

EID: 0030145674     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(95)01175-7     Document Type: Article

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