Three-dimensional reconstruction algorithm for electrical resistance tomography

IEE Proceedings: Science, Measurement and Technology

Volumn 145, Issue 3, 1998, Pages 85-93

  Pinheiro, P A T ^a   Loh, W W ^a   Dickin, F J ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b HEWLETT PACKARD LABORATORIES   (United Kingdom)

Author keywords

3 D image reconstruction; Impedance measurements; Process kinetics; Process tomography

Indexed keywords

ALGORITHMS; COST EFFECTIVENESS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE MEASUREMENT; IMAGE RECONSTRUCTION; MICROPROCESSOR CHIPS;

ELECTRICAL RESISTANCE TOMOGRAPHY (ERT);

MEDICAL IMAGING;

EID: 0032073720     PISSN: 13502344     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-smt:19981945     Document Type: Article

References (21)

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