Sparse matrix methods for use in electrical impedance tomography

International Journal for Numerical Methods in Engineering

Volumn 40, Issue 3, 1997, Pages 439-451

  Pinheiro, P A T ^a   Dickin, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Electrical impedance tomography; Fill in reduction; Forward problem; Simulated annealing; Sparse matrix methods

Indexed keywords

ALGORITHMS; BOUNDARY CONDITIONS; ELECTRIC IMPEDANCE MEASUREMENT; FINITE ELEMENT METHOD; INVERSE PROBLEMS; ITERATIVE METHODS; SIMULATED ANNEALING;

ELECTRICAL IMPEDANCE TOMOGRAPHY; FILL IN REDUCTION; FINITE ELEMENT LABELLING ALGORITHMS; FORWARD PROBLEM; SPARSE MATRIX METHOD;

MATRIX ALGEBRA;

EID: 0031075733     PISSN: 00295981     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0207(19970215)40:3<439::AID-NME73>3.0.CO;2-5     Document Type: Article

References (13)

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