Smoothness-constrained inversion for two-dimensional electrical resistance tomography

Measurement Science and Technology

Volumn 8, Issue 3, 1997, Pages 293-302

  Pinheiro, P A T ^a   Loh, W W ^a   Dickin, F J ^a,b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b HEWLETT PACKARD LABORATORIES   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL FLUID DYNAMICS; CONSTRAINT THEORY; DATA ACQUISITION; ELECTRIC CONDUCTIVITY; IMAGE RECONSTRUCTION; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

ELECTRICAL RESISTANCE TOMOGRAPHY; MARQUARDT-LEVENBERG REGULARIZATION;

COMPUTERIZED TOMOGRAPHY;

EID: 0031098326     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/8/3/012     Document Type: Article

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