-
1
-
-
0026142480
-
-
vol. 39, pp. 724-731, Apr. 1993.
-
H. J. Eul and B. Schiek, "A generalized theory and new calibration procedures for network analyzer self calibration," IEEE Trans. Microwave Theory Tech., vol. 39, pp. 724-731, Apr. 1993.
-
"A Generalized Theory and New Calibration Procedures for Network Analyzer Self Calibration," IEEE Trans. Microwave Theory Tech.
-
-
Eul, H.J.1
Schiek, B.2
-
3
-
-
0029409312
-
-
vol. 43, pp. 2532-2538, Nov. 1995.
-
M. D. Wu, S. M. Deng, R. B. Wu, and P. Hsu, "Full-wave characterization of the mode conversion in a coplanar waveguide right angled bend," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 2532-2538, Nov. 1995.
-
"Full-wave Characterization of the Mode Conversion in A Coplanar Waveguide Right Angled Bend," IEEE Trans. Microwave Theory Tech.
-
-
Wu, M.D.1
Deng, S.M.2
Wu, R.B.3
Hsu, P.4
-
4
-
-
0029230145
-
-
1995, pp. 1049-1052.
-
G. David, W. Schroeder, D. Jager, and I. Wolff, "2D Electro-optic probing combined with field theory based multimode wave amplitude extraction: A new approach to on wafer measurements," in IEEEMTT-S Dig., Orlando, FL, June 1995, pp. 1049-1052.
-
"2D Electro-optic Probing Combined with Field Theory Based Multimode Wave Amplitude Extraction: A New Approach to on Wafer Measurements," in IEEEMTT-S Dig., Orlando, FL, June
-
-
David, G.1
Schroeder, W.2
Jager, D.3
Wolff, I.4
-
5
-
-
0028518354
-
-
vol. 42, pp. 1896-1903, Oct. 1994.
-
V. Eleftheriades, A. S. Omar, and L. P. Katehi, "Some important properties of waveguide junction generalized scattering matrices in the context of mode matching technique," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 1896-1903, Oct. 1994.
-
"Some Important Properties of Waveguide Junction Generalized Scattering Matrices in the Context of Mode Matching Technique," IEEE Trans. Microwave Theory Tech.
-
-
Eleftheriades, V.1
Omar, A.S.2
Katehi, L.P.3
-
6
-
-
0031379812
-
-
2-port network analyzer," presented at the 6th Topical Meeting Elect. Performances Electron. Packaging, San Jose, CA, Oct. 27-29, 1997.
-
S. Sercu and L. Martens, "Characterizing JV-port packages and interconnections with a 2-port network analyzer," presented at the 6th Topical Meeting Elect. Performances Electron. Packaging, San Jose, CA, Oct. 27-29, 1997.
-
"Characterizing JV-port Packages and Interconnections with A
-
-
Sercu, S.1
Martens, L.2
-
7
-
-
0017747923
-
-
25, pp. 1100-1115, Dec. 1977.
-
R. A. Spéciale, "A generalization of the TSD network-analyzer calibration procedure, covering ra-port scattering-parameter measurements, affected by leakage errors," IEEE Trans. Microwave Theory Tech., vol. MTT-25, pp. 1100-1115, Dec. 1977.
-
"A Generalization of the TSD Network-analyzer Calibration Procedure, Covering Ra-port Scattering-parameter Measurements, Affected by Leakage Errors," IEEE Trans. Microwave Theory Tech., Vol. MTT
-
-
Spéciale, R.A.1
-
9
-
-
0028735356
-
-
vol. 42, pp. 2261-2269, Dec. 1994.
-
F. Olyslager, D. De Zutter, and A. T. De Hoop, "New reciprocal model for lossy waveguide structure based on the orthogonality of the eigenmodes," IEEE Trans. Microwave Theory Tech., vol. 42, pp. 2261-2269, Dec. 1994.
-
"New Reciprocal Model for Lossy Waveguide Structure Based on the Orthogonality of the Eigenmodes," IEEE Trans. Microwave Theory Tech.
-
-
Olyslager, F.1
De Zutter, D.2
De Hoop, A.T.3
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