메뉴 건너뛰기




Volumn 141, Issue 1-4, 1998, Pages 279-283

Annealing behavior of tin implanted silica

Author keywords

Infrared spectroscopy; Ion implantation; Krainers Kronig transformation

Indexed keywords

ANNEALING; CHEMICAL BONDS; INFRARED SPECTROSCOPY; SILICA; SUBSTRATES; TIN;

EID: 0032067265     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00137-2     Document Type: Article
Times cited : (6)

References (12)
  • 1
    • 0029307203 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1995) J. Vac. Sci. Technol. B , vol.13 , pp. 1198
    • Henderson, D.O.1
  • 2
    • 0030565943 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1996) J. Non-Cryst. Solids , vol.205-207 , pp. 788
    • Henderson, D.O.1
  • 3
    • 0000817938 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1996) J. Vac. Sci. Technol. A , vol.14 , pp. 1199
    • Henderson, D.O.1
  • 4
    • 0029307203 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1996) J. Vac. Sci. Technol. A , vol.14 , pp. 1482
    • Mu, R.1
  • 5
    • 0029307203 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1989) Mat. Sci. Rep. , vol.4 , pp. 43
    • White, C.W.1
  • 6
    • 0001718690 scopus 로고    scopus 로고
    • D.O. Henderson et al, J. Vac. Sci. Technol. B 13 (1995) 1198; D.O. Henderson et al., J. Non-Cryst. Solids 205-207 (1996) 788; D.O. Henderson et al., J. Vac. Sci. Technol. A 14 (1996) 1199; R. Mu et al., J. Vac. Sci. Technol. A 14 (1996) 1482; C.W. White et al., Mat. Sci. Rep. 4 (1989) 43; C.W. White et al., J. Appl. Phys. 79 (1996) 1876.
    • (1996) J. Appl. Phys. , vol.79 , pp. 1876
    • White, C.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.