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Volumn 231, Issue 1-2, 1996, Pages 155-158

High-resolution transmission electron microscopy of ion irradiated uranium oxide

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); FOURIER OPTICS; GRAIN BOUNDARIES; ION IMPLANTATION; IRRADIATION; NUCLEAR FUEL PELLETS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; THERMAL CONDUCTIVITY OF SOLIDS; TRANSMISSION ELECTRON MICROSCOPY; XENON;

EID: 0030197826     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3115(96)00369-8     Document Type: Letter
Times cited : (50)

References (18)
  • 7
    • 30244527109 scopus 로고
    • ed. P. Vincenzini, Advances in Science and Technology 3D Techna Srl.
    • Hj. Matzke, in: Ceramics: Charting the Future, ed. P. Vincenzini, Advances in Science and Technology 3D (Techna Srl., 1995) p. 2913.
    • (1995) Ceramics: Charting the Future , pp. 2913
    • Matzke, Hj.1
  • 17
    • 85029990965 scopus 로고    scopus 로고
    • submitted for publication
    • I.L.F. Ray, Hj. Matzke, H. Thiele and M. Kinoshita, in: CEC Report EUR 15154 EN (1992) p. 17; J. Nucl. Mater., submitted for publication.
    • J. Nucl. Mater.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.