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Volumn 231, Issue 1-2, 1996, Pages 155-158
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High-resolution transmission electron microscopy of ion irradiated uranium oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
DISLOCATIONS (CRYSTALS);
FOURIER OPTICS;
GRAIN BOUNDARIES;
ION IMPLANTATION;
IRRADIATION;
NUCLEAR FUEL PELLETS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SINGLE CRYSTALS;
THERMAL CONDUCTIVITY OF SOLIDS;
TRANSMISSION ELECTRON MICROSCOPY;
XENON;
EDGE DISLOCATIONS;
GRAIN SUBDIVISION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
IMAGE FILTERING;
ION IRRADIATION;
NEUTRON RESONANCE CAPTURE;
POLYGONIZATION;
RIM EFFECT;
URANIUM DIOXIDE;
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EID: 0030197826
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3115(96)00369-8 Document Type: Letter |
Times cited : (50)
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References (18)
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