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Volumn 267, Issue 3-4, 1996, Pages 243-253
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Temperature dependent microstructural modification in ion-irradiated Tl-type high temperature superconductors
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONDUCTIVITY MEASUREMENT;
ION BOMBARDMENT;
IONS;
MAGNETIC VARIABLES MEASUREMENT;
MICROSTRUCTURE;
RADIATION DAMAGE;
SINGLE CRYSTALS;
SUPERCONDUCTING TRANSITION TEMPERATURE;
THALLIUM COMPOUNDS;
THERMAL CONDUCTIVITY;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
CRITICAL FLUENCE;
DAMAGE RECOVERY;
ION IRRADIATION DAMAGE;
IRRADIATION TEMPERATURES;
TEMPERATURE DEPENDENT MICROSTRUCTURAL MODIFICATION;
THALLIUM BASED HIGH TEMPERATURE SUPERCONDUCTORS;
HIGH TEMPERATURE SUPERCONDUCTORS;
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EID: 0030216249
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/0921-4534(96)00282-1 Document Type: Article |
Times cited : (9)
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References (24)
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