High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relation to their effect on Jc

Physica C: Superconductivity and its Applications

Volumn 268, Issue 1-2, 1996, Pages 161-172

  Wiesner, J ^a,b   Traeholt C ^a   Wen, J G ^d   Zandbergen, H W ^a   Wirth, G ^c   Fuess, H ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRON MICROSCOPY; IONS; OXIDE SUPERCONDUCTORS;

EFFICIENT PINNING CENTERS;

SUPERCONDUCTING FILMS;

EID: 0030242745     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(96)00381-4     Document Type: Article

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