Defect distributions in a-SixGe1-x:H

Journal of Non-Crystalline Solids

Volumn 227-230, Issue PART 1, 1998, Pages 432-436

  Carius, R ^a   Stiebig, H ^a   Siebke, F ^a   Folsch J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Alloys; Defects; Density of states; Germanium; Modelling; Silicon

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS ALLOYS; COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; ENERGY GAP;

PHOTHERMAL DEFLECTION SPECTROSCOPY; PHOTOCURRENT METHOD;

SILICON ALLOYS;

EID: 0032065062     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00088-X     Document Type: Article

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