CPM and PDS - a critical interpretation of experimental results

Materials Research Society Symposium - Proceedings

Volumn 420, Issue , 1996, Pages 715-720

  Stiebig, Helmut ^a   Siebke, Frank ^a   Carius, Reinhard ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; ANNEALING; COMPUTER SIMULATION; DEFECTS; ELECTRON TRANSITIONS; ELECTRONIC DENSITY OF STATES; FERMI LEVEL;

CHARGE CAPTURE PROCESSES; CHARGE STATES; CONSTANT PHOTOCURRENT METHOD; ENERGY DISTRIBUTION; PHOTOTHERMAL DEFLECTION SPECTROSCOPY; URBACH TAIL;

AMORPHOUS SILICON;

EID: 0030380551     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-420-715     Document Type: Conference Paper

References (9)