Frequency resolved spectroscopy in a-Si:H/a-Si1-xNx:H multilayers and band-edge modulated a-Si1-xNx:H alloys

Journal of Non-Crystalline Solids

Volumn 227-230, Issue PART 1, 1998, Pages 517-522

  Ogihara, C ^a  

^a YAMAGUCHI UNIVERSITY   (Japan)

Author keywords

Amorphous semiconductors; Band edge modulation; Lifetime distribution; Multilayer luminescence

Indexed keywords

AMORPHOUS ALLOYS; PHOTOLUMINESCENCE; SEMICONDUCTOR SUPERLATTICES; SILICON NITRIDE; SPECTROSCOPIC ANALYSIS; THERMAL EFFECTS;

BAND EDGE MODULATION (BM); FREQUENCY RESOLVED SPECTROSCOPY;

AMORPHOUS FILMS;

EID: 0032065061     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00093-3     Document Type: Article

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