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Volumn 19, Issue 4, 1998, Pages 103-105

SiGe power HBT's for low-voltage, high-performance RF applications

Author keywords

[No Author keywords available]

Indexed keywords

POWER ELECTRONICS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING;

EID: 0032050343     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.663528     Document Type: Article
Times cited : (55)

References (7)
  • 3
    • 84865890908 scopus 로고    scopus 로고
    • IBM's SiGe technology home page at: http://www.chips.ibm.com /sige/technology.html.
  • 6
    • 0030418850 scopus 로고    scopus 로고
    • Large-signal modeling of self-heating, collector transit-time, and RF breakdown effects in power HBT's
    • Dec.
    • C. J. Wei, J. C. M. Hwang, W-J. Ho, and J. A. Higgins, "Large-signal modeling of self-heating, collector transit-time, and RF breakdown effects in power HBT's," IEEE Trans. Microwave Theory Tech., vol. 44, pp. 2641-2647, Dec. 1996.
    • (1996) IEEE Trans. Microwave Theory Tech. , vol.44 , pp. 2641-2647
    • Wei, C.J.1    Hwang, J.C.M.2    Ho, W.-J.3    Higgins, J.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.