MBE growth of quantum-size Si-dots on SiC(0001) monitored by RHEED

Thin Solid Films

Volumn 318, Issue 1-2, 1998, Pages 88-92

  Fissel, A ^a   Pfennighaus, K ^a   Richter, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Quantum dot; Reflection high energy electron diffraction; Sic(0001)

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; DIFFUSION IN SOLIDS; MOLECULAR BEAM EPITAXY; MONOLAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING SILICON; SILICON CARBIDE;

STRANSKI-KRASTANOW GROWTH MODE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0032049388     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01145-0     Document Type: Article

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