Compact stand-alone near-field optical microscope combined with force detection

Applied Optics

Volumn 37, Issue 10, 1998, Pages 1808-1813

  Baida, Fadi Issam ^a   Courjon, Daniel ^a   Bielefeldt, Hartmut ^a,b  

^a CNRS   (France)

^b UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIGHT POLARIZATION; LIGHT REFLECTION; MICROSCOPES; OPTICAL DESIGN; OPTICAL FIBERS; SCANNING TUNNELING MICROSCOPY;

COMPACT STAND ALONE NEAR FIELD OPTICAL MICROSCOPE; FORCE DETECTION; SCANNING TUNNELING OPTICAL MICROSCOPE;

OPTICAL MICROSCOPY;

EID: 0032048708     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.001808     Document Type: Article

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