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Volumn 31, Issue 1-2, 1996, Pages 1-8
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Morphological analysis of nanocrystalline SnO2 for gas sensor applications
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Author keywords
Annealing; Gas sensors; Nanoparticles; SnO2; Thin layers
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Indexed keywords
ANNEALING;
CHEMICAL SENSORS;
CRYSTAL DEFECTS;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
GRAIN SIZE AND SHAPE;
INTERFACES (MATERIALS);
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
PARTICLE SIZE ANALYSIS;
RAMAN SPECTROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
GRAIN SIZE INCREASE;
MICRO RAMAN SPECTROSCOPIES;
MORPHOLOGICAL ANALYSIS;
THEORY OF AVERAGE DIELECTRIC CONSTANT;
TIN DIOXIDE;
TIN COMPOUNDS;
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EID: 0030087229
PISSN: 09254005
EISSN: None
Source Type: Journal
DOI: 10.1016/0925-4005(96)80007-4 Document Type: Article |
Times cited : (200)
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References (22)
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