Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 2, 1998, Pages 499-506

  Roca, Elisenda ^b   Frutos, Fabián ^c   Espejo, Servando ^a,b,c   Domínguez Castro, Rafael ^a,b,c   Rodríguez Vázquez, Angel ^a,b,c  

^a IEEE

^b INSTITUTO DE MICROELECTRÓNICA DE SEVILLA   (Spain)

^c UNIVERSITY OF SEVILLE   (Spain)

Author keywords

CMOS integrated circuits; Electrooptics measurements; Image sensors; Optical arrays; Photodetectors

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER CONTROL; IMAGE SENSORS; PHOTODETECTORS;

ELECTROOPTICAL MEASUREMENT SYSTEMS; VISION CHIPS;

ELECTROOPTICAL DEVICES;

EID: 0032035542     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.744198     Document Type: Article

References (9)

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