Transmission scanning near-field optical microscopy with uncoated silicon tips

Ultramicroscopy

Volumn 71, Issue 1-4, 1998, Pages 371-377

  Danzebrink, Hans U ^a   Castiaux, Annick ^b   Girard, Christian ^c   Bouju, Xavier ^c   Wilkening, Günter ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b UNIVERSITY OF NAMUR   (Belgium)

^c UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

Atomic force microscopy (AFM); Near field optical microscopy (NFOM); Tip scanning instrumentation design and characterization

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; NANOSTRUCTURED MATERIALS; PROBES;

SILICON TIPS; TRANSMISSION SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; IMAGE PROCESSING; INFRARED RADIATION; MICROSCOPY; OPTICS; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0032033275     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00101-0     Document Type: Article

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