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Volumn 34, Issue 6, 1998, Pages 594-595

An In0.5(Al0.3Ga0.7)0.5P/ln 0.2Ga0.8As power HEMT with 65.2% power-added efficiency under 1.2V operation

Author keywords

[No Author keywords available]

Indexed keywords

HETEROJUNCTIONS; POWER ELECTRONICS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0032023313     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19980430     Document Type: Article
Times cited : (7)

References (8)
  • 1
    • 0027307622 scopus 로고
    • 3V operation L-band power double-doped heterojunction FETs
    • IWATA, N., INOSAKO, K., and KUZUHARA, M.: '3V operation L-band power double-doped heterojunction FETs'. IEEE MTT-S Dig., 1993, pp. 1465-1468
    • (1993) IEEE MTT-S Dig. , pp. 1465-1468
    • Iwata, N.1    Inosako, K.2    Kuzuhara, M.3
  • 3
    • 11744301304 scopus 로고
    • Se-related deep levels in InGaAlP
    • WATANABE, M.O., and OHBA, Y.: 'Se-related deep levels in InGaAlP', J. Appl. Phys., 1986, 60, pp. 1032-1037
    • (1986) J. Appl. Phys. , vol.60 , pp. 1032-1037
    • Watanabe, M.O.1    Ohba, Y.2
  • 4
    • 0000536410 scopus 로고
    • Interface properties for GaAs/ InGaAlP heterojunctions by the capacitance-voltage profiling technique
    • WATANABE, M.O., and OHBA, Y.: 'Interface properties for GaAs/ InGaAlP heterojunctions by the capacitance-voltage profiling technique', Appl. Phys. Lett., 1987, 50, pp. 906-908
    • (1987) Appl. Phys. Lett. , vol.50 , pp. 906-908
    • Watanabe, M.O.1    Ohba, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.