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Volumn 145, Issue 2, 1998, Pages 669-675
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Scanning force microscopy investigation of surface forces at the tungsten oxide/lithium borate interface
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROCHEMISTRY;
ETCHING;
LITHIUM COMPOUNDS;
MICROSCOPIC EXAMINATION;
OXIDATION;
TUNGSTEN COMPOUNDS;
FORCE DISTANCE (FD) INTERACTIONS;
LITHIUM BORATE;
SCANNING FORCE MICROSCOPY (SFM);
TUNGSTEN OXIDE;
INTERFACES (MATERIALS);
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EID: 0032002012
PISSN: 00134651
EISSN: None
Source Type: Journal
DOI: 10.1149/1.1838321 Document Type: Article |
Times cited : (2)
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References (22)
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