SCOPUS 정보 검색 플랫폼

Volumn 313-314, Issue , 1998, Pages 537-543

Response of the surface dielectric function to dynamic surface modifications: Application of reflectance anisotropy spectroscopy and spectroscopic ellipsometry

(7) Zettler, J T a Pristovsek, M a Trepk, T a Shkrebtii, A a Steimetz, E a Zorn, M a Richter, W a

a TECHNISCHE UNIVERSITÄT BERLIN (Germany)

Author keywords

Ellipsometry; GaAs; Reflectance anisotropy spectroscopy; Surface dielectric function; Surface reconstruction

Indexed keywords

ABSORPTION; DESORPTION; DIELECTRIC PROPERTIES OF SOLIDS; ELLIPSOMETRY; HIGH TEMPERATURE OPERATIONS; LIGHT REFLECTION; METALLORGANIC VAPOR PHASE EPITAXY; MORPHOLOGY; OSCILLATIONS; SEMICONDUCTOR GROWTH; SPECTROSCOPIC ANALYSIS; SURFACE TREATMENT;

REFLECTANCE ANISOTROPY SPECTROSCOPY (RAS); SPECTROSCOPIC ELLIPSOMETRY (SE); SURFACE DIELECTRIC FUNCTIONS;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0032001182 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00880-8 Document Type: Article

Times cited : (9)

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