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84881141054
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0001648535
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de Graaf M J, Severens R J, Dahiya R P, van de Sanden M C M and Schram DC 1993 Phys. Rev. E 48 2098 Qing Z, de Graaf M J, van de Sanden M C M, Otorbaev D K and Schram D C 1994 Rev. Sci. Instrum. 65 1469
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36448999874
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de Graaf M J, Severens R J, Dahiya R P, van de Sanden M C M and Schram DC 1993 Phys. Rev. E 48 2098 Qing Z, de Graaf M J, van de Sanden M C M, Otorbaev D K and Schram D C 1994 Rev. Sci. Instrum. 65 1469
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Qing, Z.1
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Schram, D.C.5
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11
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0029344912
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Severens R J, Brussaard G J H, van de Sanden M C M and Schram D C 1995 Appl. Phys. Lett. 67 491 Severens R J, Brussaard G J H, Verhoeven H J M, van de Sanden M C M and Schram DC 1995 Mater. Res. Soc. Symp. Proc. vol 377 (Pittsburgh, PA: Materials Research Society) p 33
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Brussaard, G.J.H.2
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Schram, D.C.4
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0029517653
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Pittsburgh, PA: Materials Research Society
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Severens R J, Brussaard G J H, van de Sanden M C M and Schram D C 1995 Appl. Phys. Lett. 67 491 Severens R J, Brussaard G J H, Verhoeven H J M, van de Sanden M C M and Schram DC 1995 Mater. Res. Soc. Symp. Proc. vol 377 (Pittsburgh, PA: Materials Research Society) p 33
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Severens, R.J.1
Brussaard, G.J.H.2
Verhoeven, H.J.M.3
Van De Sanden, M.C.M.4
Schram, D.C.5
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13
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36449003475
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Buuron A J M, van de Sanden M C M, van Ooij W J, Driessens R M A and Schram D C 1995 J. Appl. Phys. 78 528 Gielen J W A M, van de Sanden M C M and Schram D C 1996 Appl. Phys. Lett. 69 152 Gielen J W A M, Kleuskens P R M, van de Sanden M C M, Ijzendoorn L J, Schram D C, Dekempeneer EHA and Meneve J 1996 J. Appl. Phys. 80 5986
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Driessens, R.M.A.4
Schram, D.C.5
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14
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0001323515
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Buuron A J M, van de Sanden M C M, van Ooij W J, Driessens R M A and Schram D C 1995 J. Appl. Phys. 78 528 Gielen J W A M, van de Sanden M C M and Schram D C 1996 Appl. Phys. Lett. 69 152 Gielen J W A M, Kleuskens P R M, van de Sanden M C M, Ijzendoorn L J, Schram D C, Dekempeneer EHA and Meneve J 1996 J. Appl. Phys. 80 5986
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Gielen, J.W.A.M.1
Van De Sanden, M.C.M.2
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15
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0000803560
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Buuron A J M, van de Sanden M C M, van Ooij W J, Driessens R M A and Schram D C 1995 J. Appl. Phys. 78 528 Gielen J W A M, van de Sanden M C M and Schram D C 1996 Appl. Phys. Lett. 69 152 Gielen J W A M, Kleuskens P R M, van de Sanden M C M, Ijzendoorn L J, Schram D C, Dekempeneer EHA and Meneve J 1996 J. Appl. Phys. 80 5986
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Gielen, J.W.A.M.1
Kleuskens, P.R.M.2
Van De Sanden, M.C.M.3
Ijzendoorn, L.J.4
Schram, D.C.5
Dekempeneer, E.H.A.6
Meneve, J.7
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16
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0004702791
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Beulens J J, Wilbers A T M, Haverlag M, Oehrlein G S, Kroesen G M W and Schram D C 1992 J. Vac. Sci. Technol. B 10 2387
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Beulens, J.J.1
Wilbers, A.T.M.2
Haverlag, M.3
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Schram, D.C.6
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17
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0004101910
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New York: Interscience
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Spitzer L 1956 Physics of Fully Ionized Gases (New York: Interscience). The Spitzer resistivity is slightly different from the resistivity calculated on the basis of Frost's mixing rule for ionization degrees higher than 1% and electron temperatures greater than 1 eV, cf references in [14] and Zhou Qing 1995 PhD Thesis Eindhoven University of Technology. The assumption of a flat electron density profile is insignificant and the use of a parabolic profile for the electron density leads to small differences for the obtained electron temperature
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(1956)
Physics of Fully Ionized Gases
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-
Spitzer, L.1
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18
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-
11744365062
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-
PhD Thesis Eindhoven University of Technology. The assumption of a flat electron density profile is insignificant and the use of a parabolic profile for the electron density leads to small differences for the obtained electron temperature
-
Spitzer L 1956 Physics of Fully Ionized Gases (New York: Interscience). The Spitzer resistivity is slightly different from the resistivity calculated on the basis of Frost's mixing rule for ionization degrees higher than 1% and electron temperatures greater than 1 eV, cf references in [14] and Zhou Qing 1995 PhD Thesis Eindhoven University of Technology. The assumption of a flat electron density profile is insignificant and the use of a parabolic profile for the electron density leads to small differences for the obtained electron temperature
-
(1995)
-
-
Qing, Z.1
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20
-
-
0004189682
-
-
ed R D Huddlestone and S I Leonard (New York: Academic)
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Chen F F 1965 Plasma Diagnostic Techniques ed R D Huddlestone and S I Leonard (New York: Academic)
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(1965)
Plasma Diagnostic Techniques
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Chen, F.F.1
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21
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0043081584
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Meulenbroeks R F G, Steenbakkers M F M, Qing Z, van de Sanden M C M and Schram D C 1994 Phys. Rev. E 49 2272
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(1994)
Phys. Rev. E
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Meulenbroeks, R.F.G.1
Steenbakkers, M.F.M.2
Qing, Z.3
Van De Sanden, M.C.M.4
Schram, D.C.5
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22
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0003834831
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Brussaard G J H, van der Steen M, Carrère M, van de Sanden M C M and Schram DC 1996 Phys. Rev. E 54 1906
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(1996)
Phys. Rev. E
, vol.54
, pp. 1906
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Brussaard, G.J.H.1
Van Der Steen, M.2
Carrère, M.3
Van De Sanden, M.C.M.4
Schram, D.C.5
-
29
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-
11744333775
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-
note
-
-1 gives 0.16.
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