Grid quality and its influence on accuracy and convergence in device simulation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 17, Issue 2, 1998, Pages 149-157

  Axelrad, V ^a,b  

^a Technology Modeling Associates Inc   (United States)

^b SEQUOIA Design Systems   (United States)

Author keywords

Accuracy; Breakdown; Convergence; Device design; Grid generation; Numerical analysis; Power semiconductor devices; Semiconductor device simulation

Indexed keywords

COMPUTER SIMULATION; CONVERGENCE OF NUMERICAL METHODS; ELECTRIC BREAKDOWN OF SOLIDS; ERROR ANALYSIS; FINITE ELEMENT METHOD;

GRID GENERATION;

SEMICONDUCTOR DEVICE MODELS;

EID: 0031998952     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.681264     Document Type: Article

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