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Volumn 27, Issue 2, 1998, Pages 85-88
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ZnSe heteroepitaxy on GaAs (110) substrate
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Author keywords
Etch pit density (EPD); GaAs (110); Molecular beam epitaxy (MBE); ZnSe
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Indexed keywords
CRYSTALLINE MATERIALS;
DISLOCATIONS (CRYSTALS);
ETCHING;
INTERFACES (MATERIALS);
MOLECULAR BEAM EPITAXY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
SUBSTRATES;
ETCH PIT DENSITY (EPD);
RUTHERFORD BACKSCATTERING CHANNELING MEASUREMENTS;
SEMICONDUCTING ZINC COMPOUNDS;
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EID: 0031996833
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-998-0194-0 Document Type: Article |
Times cited : (2)
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References (12)
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