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Journal of Crystal Growth

Volumn 159, Issue 1-4, 1996, Pages 573-581

Characterization of low defect density blue-green lasers

(8) Petruzzello, J a Haberern, K W a Herko, S P a Marshall, T a Gaines, J M a Guha, S b,c U'Ren, G D b Haugen, G M b

a PHILIPS RESEARCH LABORATORIES (Netherlands)

b 3M COMPANY (United States)

c IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLADDING (COATING); CRYSTAL DEFECTS; IMAGING TECHNIQUES; LIGHT PROPAGATION; PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

DEFECT DENSITY; LATTICE MATCHING; OPTICAL IMAGING; PHOTOLUMINESCENCE IMAGING; SEPARATE CONFINEMENT HETEROSTRUCTURE LASERS;

SEMICONDUCTOR LASERS;

EID: 0030562480 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/0022-0248(95)00880-2 Document Type: Article

Times cited : (18)

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