Anisotropic elastic characterization of surfaces from 2 MHz to 20 GHz

Ultrasonics

Volumn 36, Issue 1-5, 1998, Pages 317-321

  Briggs, Andrew ^a   Kolosov, Oleg ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Acoustic microscopy; Brillouin spectroscopy; Scanning interference fringe; Surface acoustic wave; Ultrasonic force microscopy; Ultrasonic microspectrometer

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ACOUSTIC WAVE INTERFERENCE; ANISOTROPY; ELASTICITY; SPECTROMETERS; STRESS ANALYSIS; SURFACE PROPERTIES; ULTRASONIC IMAGING; ULTRASONIC TRANSDUCERS; VELOCITY MEASUREMENT;

ACOUSTIC MICROSCOPY; BRILLOUIN SPECTROSCOPY; ULTRASONIC FORCE MICROSCOPY; ULTRASONIC MICROSPECTROMETERS;

ULTRASONIC TESTING;

EID: 0031995853     PISSN: 0041624X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0041-624X(97)00090-5     Document Type: Article

References (22)

1. T. Berruti, M.M. Gola, G.A.D. Briggs, Acoustoelastic measurements in aluminium alloy specimens by means of a contact and the non-contact LFB acoustic microscopy technique, J. Acoust. Soc. Am. (1997) in press.
2. H. Nishino, Y. Tsukahara, Y. Nagata, T. Koda, K. Yamanaka, Excitation of high-frequency surface acoustic waves by phase velocity scanning of a laser interference fringe, Appl. Phys. Lett. 62 (1993) 2036-2038.
3. K. Yamanaka, New approaches in acoustic microscopy for non-contact measurement and ultra high resolution, in: G.A.D. Briggs (Ed.), Advances in Acoustic Microscopy 1, Plenum Press, New York, 1995, pp. 301-342.
4. Z. Sklar, P. Mutti, N.C. Stoodley, G.A.D. Briggs, Measuring the elastic properties of stressed materials by quantitative acoustic microscopy, in: G.A.D. Briggs (Ed.), Advances in Acoustic Microscopy 1, Plenum Press, New York, 1995, pp. 209-247.
5. Y. Tsukahara, N. Nakaso, K. Ohira, M. Yanaka, Interaction of acoustic waves with solid surfaces, in: G.A.D. Briggs, W. Arnold (Eds.), Advances in Acoustic Microscopy 2, Plenum Press, 1996, pp. 103-165.
6. N. Nakaso, K. Ohira and Y. Tsukahara, Reflection coefficient measurement of anisotropic materials by ultrasonic micro-spectrometer, in: Proc. 1990 IEEE Ultrason. Symp., IEEE, 1991, pp. 713-718.
7. G.A.D. Briggs, Acoustic Microscopy, Clarendon Press, Oxford, 1992.
8. J. Kushibiki, N. Chubachi, Material characterisation by line-focus beam acoustic microscope, IEEE Trans. Sonics Ultrason. 32 (1985) 189-212.
9. S.I. Berezina, Acoustic microscope applications to the measurement of the orientation dependencies of SAW-velocity in crystals. Proc. Soviet Union Conf. Acoustoelectronics and Quantum Acoustics, Dushanbe, 1981, pp. 84-85.
10. A. Atalar, H. Köymen, A. Bozkurt, G. Yaralioglu, Lens geometries for quantitative acoustic microscopy, in: G.A.D. Briggs (Ed.), Advances in Acoustic Microscopy 1 , Plenum Press, New York, 1995, pp. 117-151.
11. J.D. Achenbach, J.O. Kim, Y.-C. Lee, Measuring thin-film elastic constants by line-focus acoustic microscopy, in: G.A.D. Briggs (Ed.), Advances in Acoustic Microscopy 1, Plenum Press, New York, 1995, pp. 153-208.
12. 3 wafers by line-focus beam acoustic microscopy, IEEE Trans. Ultrason. Ferro. Freq. Control 42 (1995) 83.
13. P. Mutti, C.E. Bottani, G. Ghislotti, M. Beghi, G.A.D. Briggs, J.R. Sandercock, Surface Brillouin scattering - Extending surface wave measurements to 20GHz, in: G.A.D. Briggs (Ed.), Advances in Acoustic Microscopy 1, Plenum Press, New York, 1995, pp. 249-300.
14. BriSc, Bede Scientific Instruments Ltd., Lindsey Park, Bowburn, Durham DH6 5PF, UK: http://www.bede.co.uk.
15. P.D. Warren, C. Pecorari, O.V. Kolosov, S.G. Roberts, G.A.D. Briggs, Characterisation of surface damage via surface acoustic waves, Nanotechnology 7 (1996) 295-301.
16. O. Kolosov, K. Yamanaka, Nonlinear detection of ultrasonic vibrations in an atomic force microscope, Jpn. J. Appl. Phys. Lett. 32 (1993) L1095.
17. U. Rabe, W. Arnold, Atomic-force microscopy at MHz frequencies, Annalen der Physik 3 (1994) 589-598.
18. U. Rabe, V. Sherer, S. Hirsekorn, W. Arnold, Nanomechanical surface characterization by atomic force microscopy, Journal of Vacuum Science & Technology B15 (1997) 1506-1511.
19. N.A. Burnham, A.J. Kulik, G. Gremaud, P.J. Gallo, F. Oulevey, Scanning local-acceleration microscopy, Journal of Vacuum Science & Technology B14 (1996) 794-799.
20. O. Kolosov, M.R. Castell, C. Marsh, G.A.D. Briggs, T. Kamins, S. Williams, Direct imaging of elastic nanostructure of Ge islands by ultrasonic force microscopy. (1997) submitted for publication.
21. N.A. Burnham, G. Gremaud, A.J. Kulik, P.J. Gallo, F. Oulevey, Materials properties measurements - choosing the optimal scanning probe microscope configuration. Journal of Vacuum Science & Technology 814 (1996) 1308-1312.
22. T.E. Matikas, R.L. Crane, Ultrasonic nondestructive techniques for materials characterization, MRS Bulletin 21 (10) (1996) 18-21.