Ultra low noise, PC-based measurement system for the characterization of the metallizations of integrated circuits

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1996, Pages 319-324

  Ciofi, C ^a   De Marinis, M ^a   Neri, B ^a  

^a UNIVERSITY OF PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL; DATA ACQUISITION; ELECTROMIGRATION; INDUSTRIAL APPLICATIONS; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; OPTICAL LINKS; PERSONAL COMPUTERS; SYSTEMS ANALYSIS;

METALLIZATION; ULTRA LOW NOISE DATA ACQUISITION SYSTEM; ULTRA LOW NOISE PREAMPLIFIER;

SIGNAL NOISE MEASUREMENT;

EID: 0029703562     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)