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Volumn 28, Issue 1, 1998, Pages 77-90

Secondary electron yield measurements as a means for probing organic films on aerosol particles

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON ENERGY LEVELS; MONOLAYERS; POTASSIUM COMPOUNDS; SODIUM CHLORIDE; VAPOR DEPOSITION;

EID: 0031985224     PISSN: 02786826     EISSN: 15217388     Source Type: Journal    
DOI: 10.1080/02786829808965513     Document Type: Article
Times cited : (14)

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