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Volumn 41-42, Issue , 1998, Pages 567-570
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Contact and alignment marker technology for atomic scale device fabrication
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CONTACTS;
ELECTRODES;
FABRICATION;
PLATINUM;
THERMODYNAMIC STABILITY;
TUNGSTEN;
ATOMIC SCALE DEVICES;
NANOTECHNOLOGY;
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EID: 0031707683
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(98)00133-6 Document Type: Article |
Times cited : (4)
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References (11)
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