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Volumn 123-124, Issue , 1998, Pages 339-342
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Characterization of semiconductor heterostructures and quantum dots by friction force microscopy
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Author keywords
Compositional maps; Friction force microscopy; Semiconductor heterostructures
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Indexed keywords
COMPOSITION EFFECTS;
FRICTION;
HETEROJUNCTIONS;
MOLECULAR BEAM EPITAXY;
MONOLAYERS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SEMICONDUCTOR QUANTUM DOTS;
SEMICONDUCTOR QUANTUM WELLS;
FRICTION FORCE MICROSCOPY;
INDIUM GALLIUM ARSENIDE;
SEMICONDUCTOR DEVICE STRUCTURES;
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EID: 0031706924
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(97)00467-4 Document Type: Article |
Times cited : (2)
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References (18)
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