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Volumn 123-124, Issue , 1998, Pages 339-342

Characterization of semiconductor heterostructures and quantum dots by friction force microscopy

Author keywords

Compositional maps; Friction force microscopy; Semiconductor heterostructures

Indexed keywords

COMPOSITION EFFECTS; FRICTION; HETEROJUNCTIONS; MOLECULAR BEAM EPITAXY; MONOLAYERS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS;

EID: 0031706924     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00467-4     Document Type: Article
Times cited : (2)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.