Friction force microscopy characterization of semiconductor heterostructures

Materials Science and Engineering B

Volumn 42, Issue 1-3, 1996, Pages 122-126

  Tamayo, J ^a   Garcia R ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

Gallium; Indium; Multiquantum wells; Semiconductors

Indexed keywords

FORCE MEASUREMENT; INTERFACES (MATERIALS); SCANNING; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

CHEMICAL SENSITIVITY; FRICTIONAL FORCE MICROSCOPY; SCANNING FORCE MICROSCOPY;

HETEROJUNCTIONS;

EID: 0042123186     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(96)01692-3     Document Type: Article

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