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Volumn 10, Issue 1, 1998, Pages 45-47

Low-threshold laterally oxidized GaInP-AlGaInP quantum-well laser diodes

Author keywords

AlGaInP; Annealing; Lasers; Lateral oxidation; Native oxide; Quantum well lasers; Semiconductor lasers

Indexed keywords

ANNEALING; CURRENT DENSITY; OXIDATION; QUANTUM EFFICIENCY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0031673142     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.651097     Document Type: Article
Times cited : (5)

References (10)
  • 2
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    • (1995) IEEE J. Select. Topics Quantum Electron. , vol.1 , pp. 723-727
    • Kobayashi, R.1    Hotta, H.2    Miyasaka, F.3    Hara, K.4    Kobayashi, K.5
  • 3
    • 0028764159 scopus 로고
    • Native-oxide defined ring contact for low threshold vertical-cavity lasers
    • D. L. Huffaker, D. G. Deppe, K. Kumar and T. J. Rogers, "Native-oxide defined ring contact for low threshold vertical-cavity lasers," Appl. Phys. Lett., vol. 65, 1994, pp. 97-99.
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 97-99
    • Huffaker, D.L.1    Deppe, D.G.2    Kumar, K.3    Rogers, T.J.4
  • 4
    • 11644327891 scopus 로고
    • Low threshold voltage vertical-cavity lasers fabricated by selective oxidation
    • K. L. Lear, K. D. Choquette, R. P. Schneider, Jr., S. P. Kilcoyne, and K. M. Geib, "Low threshold voltage vertical-cavity lasers fabricated by selective oxidation," Electron. Lett., vol. 31, 1995, pp. 2043-2044.
    • (1995) Electron. Lett. , vol.31 , pp. 2043-2044
    • Lear, K.L.1    Choquette, K.D.2    Schneider Jr., R.P.3    Kilcoyne, S.P.4    Geib, K.M.5
  • 6
    • 0030085682 scopus 로고    scopus 로고
    • Lasing characteristics of high-performance narrow-stripe InGaAs-GaAs quantum-well lasers confined by AlAs native oxide
    • Y. Cheng, P. D. Dapkus, M. H. MacDougal, and G. M. Yang, "Lasing characteristics of high-performance narrow-stripe InGaAs-GaAs quantum-well lasers confined by AlAs native oxide," IEEE Photon. Technol. Lett., vol. 8, pp. 176-178, 1996.
    • (1996) IEEE Photon. Technol. Lett. , vol.8 , pp. 176-178
    • Cheng, Y.1    Dapkus, P.D.2    MacDougal, M.H.3    Yang, G.M.4
  • 7
    • 0030215973 scopus 로고    scopus 로고
    • High performance 660 nm InGaP/AlGaInP quantum well metal cladding ridge waveguide laser diode
    • D. Sun, D. W. Treat, and D. P. Bour, "High performance 660 nm InGaP/AlGaInP quantum well metal cladding ridge waveguide laser diode," Electron. Lett., vol. 32, 1996, pp. 1488-1490.
    • (1996) Electron. Lett. , vol.32 , pp. 1488-1490
    • Sun, D.1    Treat, D.W.2    Bour, D.P.3
  • 9
    • 0344722724 scopus 로고
    • Threshold current density reduction by annealing in 630-650 nm GaInP strained single quantum well lasers
    • San Diego, CA, ch. 5
    • I. Nomura and K. Kishino, "Threshold current density reduction by annealing in 630-650 nm GaInP strained single quantum well lasers," in Proc. 21st Int. Symp. Compound Semiconductors, San Diego, CA, 1994, ch. 5, pp. 507-512.
    • (1994) Proc. 21st Int. Symp. Compound Semiconductors , pp. 507-512
    • Nomura, I.1    Kishino, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.