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Volumn 45, Issue 1, 1998, Pages 257-263

Electromechanical coupling constant extraction of thin-film piezoelectric materials using a bulk acoustic wave resonator

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC RESONATORS; MATHEMATICAL MODELS; RESONANCE; THIN FILM DEVICES; X RAY DIFFRACTION ANALYSIS;

EID: 0031672244     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.646930     Document Type: Article
Times cited : (77)

References (13)
  • 3
    • 0029484089 scopus 로고
    • Development of miniature filters for wireless applications
    • K. M. Lakin, "Development of miniature filters for wireless applications," IEEE Trans. Microwave Theory Tech., vol. 43, pp. 2933-2939, 1995.
    • (1995) IEEE Trans. Microwave Theory Tech. , vol.43 , pp. 2933-2939
    • Lakin, K.M.1
  • 8
    • 0000013247 scopus 로고
    • A1N material constants evaluation and SAW properties on AlN/A-Oa and AlN/Si
    • K. Tsubouchi, K. Sugai, and N. Mikoshiba, "A1N material constants evaluation and SAW properties on AlN/A-Oa and AlN/Si," Proc. Ultrason. Symp., 1981, pp. 375-380.
    • (1981) Proc. Ultrason. Symp. , pp. 375-380
    • Tsubouchi, K.1    Sugai, K.2    Mikoshiba, N.3
  • 11
    • 0030643165 scopus 로고    scopus 로고
    • Characterization of the piezoelectric response of aluminum nitride grown by dc magnetron sputtering for applications in thin-film resonators
    • R. S. Naik, J. J. Lutsky, R. Reif, and C. G. Sodini, "Characterization of the piezoelectric response of aluminum nitride grown by dc magnetron sputtering for applications in thin-film resonators," Proc. Mater. Res. Soc. Symp., vol. 444, pp. 215-220, 1996.
    • (1996) Proc. Mater. Res. Soc. Symp. , vol.444 , pp. 215-220
    • Naik, R.S.1    Lutsky, J.J.2    Reif, R.3    Sodini, C.G.4
  • 13
    • 33747932505 scopus 로고    scopus 로고
    • IEEE Standard on Piezoelectricity 176-1987
    • Piscataway, NJ.
    • "IEEE Standard on Piezoelectricity 176-1987." Available from IEEE Customer Service, Piscataway, NJ.
    • Available from IEEE Customer Service


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.