Ballistic electron emission microscopy measurements of epitaxially grown Pt/CaF 2 /Si(111) structures

Applied Surface Science

Volumn 123-124, Issue , 1998, Pages 213-218

  LaBella, V P ^a   Ventrice Jr , C A ^b   Schowalter, L J ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b UNIVERSITY OF NEW ORLEANS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; ELECTRON EMISSION; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; EPITAXIAL GROWTH; MORPHOLOGY; PLATINUM; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SURFACE STRUCTURE;

BALLISTIC ELECTRON EMISSION MICROSCOPY (BEEM); CALCIUM FLUORIDE; CONDUCTION BAND MINIMUM (CBM);

MIS DEVICES;

EID: 0031655534     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00543-6     Document Type: Article

References (25)

1. W.J. Kaiser, L.D. Bell, Phys. Rev. Lett. 60 (1988) 1406.
2. L.D. Bell, W.J. Kaiser, Phys. Rev. Lett. 61 (1988) 2368.
3. T. Sajoto, J.J. O'Shea, S. Bhargava, D. Leonard, M.A. Chin, V. Narayanamurtri, Phys. Rev. Lett. 74 (1995) 3427.
4. W.J. Kaiser, M.H. Hecht, L.D. Bell, F.J. Grunthaner, J.K. Lui, L.C. Davis, Phys. Rev. B 48 (1993) 18324.
5. T.-H. Shen, M. Elliot, A.E. Fowell, A. Cafolla, B.E. Richardson, D. Westwood, R.H. Williams, J. Vac. Sci. Technol. B 9 (1991) 2219.
6. R. Ludeke, A. Bauer, E. Cartier, J. Vac. Sci. Technol. B 13 (1995) 1830.
7. M.T. Cuberes, A. Bauer, H.J. Wen, M. Prietsch, G. Kaindl, Appl. Phys. Lett. 64 (1994) 2300.
8. V.P. LaBella, C.A. Ventrice Jr. L.J. Schowalter, J. Vac. Sci. Technol. B 15 (1997), in press.
9. L.J. Schowalter, R.W. Fathauer, J. Vac. Sci. Technol. A 4 (1986) 1026.
10. Ph. Avouris, R. Wolkow, Appl. Phys. Lett. 55 (1989) 1074.
11. F. Gan, Y.-N. Xu, M.-Z. Huang, W.Y. Ching, J.G. Harrison, Phys. Rev. B 45 (1992) 8248.
12. C. Arcangeli, S. Ossicini, O. Bisi, Surf. Sci. 269/270 (1992) 743.
13. F.J. Himpsel, in: H.-J. Freund, E. Umbach (Eds.), Adsorption on Ordered Surfaces of Ionic Solids and Thin Films, Springer, Berlin, 1993, p. 3.
14. L.J. Schowalter, B.M. Kim, T.G. Thundat, C.A. Ventrice Jr., V.P. LaBella, in: Proc. MRS Conf. 466, 1997, in press.
15. R.M. Tromp, M.C. Reuter, Phys. Rev. Lett. 73 (1994) 110.
16. B.M. Kim, Ph.D. thesis, Rensselaer Polytechnic Institute, unpublished, 1996.
17. K.R. Heim, S.T. Coyle, G.G. Hembree, J.A. Venables, M.R. Scheinfein, J. Appl. Phys. 80 (1996) 1161.
18. H.L. Skirver, N.M. Rosengaard, Phys. Rev. B 46 (1992) 7157.
19. C.A. Ventrice Jr., V.P. LaBella, L.J. Schowalter, J. Vac. Sci. Technol. A 15 (1997) 830.
20. E.Y. Lee, B.R. Turner, L.J. Schowalter, J.R. Jimeniz, J. Vac. Sci. Technol. B 11 (1993) 1580.
21. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Methods and Applications, Cambridge, New York, 1994, p. 34.
22. B.M. Kim, C.A. Ventrice Jr., T. Mercer, R. Overney, L.J. Schowalter, Appl. Surf. Sci. 104/105 (1996) 409.
23. R. Ludeke, H.J. Wen, E. Cartier, J. Vac. Sci. Technol. B 14 (1996) 2855.
24. A. Bauer, R. Ludeke, Phys. Rev. Lett. 72 (1994) 928.
25. R. Ludeke, A. Bauer, E. Cartier, Appl. Phys. Lett. 66 (1995) 730.