Design of a scanning tunneling microscope for in situ topographic and spectroscopic measurements within a commercial molecular beam epitaxy machine

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 15, Issue 3, 1997, Pages 830-835

  Ventrice Jr , C A ^a   LaBella, V P ^b   Schowalter, L J ^b  

^a UNIVERSITY OF NEW ORLEANS   (United States)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001265002     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580716     Document Type: Article

References (21)

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12. Burleigh Instruments, Inc., UHVA-510 housing mount.
13. Custom manufactured by McAllister Technical Services.
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19. Machining of Mo sample holders and shadow masks was performed by McAllister Technical Services.
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21. C. A. Ventrice, Jr., V. P. LaBella, B. Gallo, and L. J. Schowalter (unpublished).