Mapping of local residual strain with an X-ray scanning apparatus

Materials Science Forum

Volumn 273-275, Issue , 1998, Pages 673-678

  Fischer, A H ^a   Schwarzer, R A ^a  

^a Inst F Metallkunde Metallphysik TU   (Germany)

Author keywords

Energy Dispersive X Ray Diffraction; Lineprofile Analysis; Local Strain; Local Texture; Pole Figures; Residual Strain; Residual Stress

Indexed keywords

CRYSTAL LATTICES; RESIDUAL STRESSES; SCANNING; SPECTROMETERS; TEXTURES; X RAY CRYSTALLOGRAPHY;

RESIDUAL LATTICE STRAIN;

MATERIALS SCIENCE;

EID: 0031652330     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

References (2)

1. A.H. Fischer and R.A. Schwarzer: X-ray pole figure measurement and texture mapping of selected areas using an x-ray scanning apparatus. Materials Science Forum this volume, p. 255-262
2. P.-C. Wang, G.S. Cargill III, I.C. Noyan, E.G Liniger, C.-K. Hu and K.Y. Lee: Thermal and electromigration strain distributions in 10 μm-wide aluminum conductor lines measured by x-ray microdiffraction, Mat. Res. Symp. Proc. Vol. 473, 1997, p.273-278