X-ray pole figure measurement and texture mapping of selected areas using an X-ray scanning apparatus

Materials Science Forum

Volumn 273-275, Issue , 1998, Pages 255-262

  Fischer, A H ^a   Schwarzer, R A ^a  

^a Inst F Metallkunde Metallphysik TU   (Germany)

Author keywords

Energy Dispersive X Ray Diffraction; Local Texture; Spatially Resolved Pole Figure Measurement

Indexed keywords

CRYSTAL STRUCTURE; GONIOMETERS; OPTICAL COLLIMATORS; TEXTURES; X RAY SPECTROSCOPY;

ENERGY DISPERSIVE X RAY DIFFRACTION; SPATIALLY RESOLVED POLE FIGURE MEASUREMENT; X RAY SCANNING APPARATUS (XSA);

X RAY CRYSTALLOGRAPHY;

EID: 0031677071     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.273-275.255     Document Type: Article

References (5)

1. R.A. Schwarzer: Advances in crystal orientation mapping with the SEM and TEM, Ultramicroscopy 67 (1997), p. 19-24
2. R.A. Schwarzer and M. Wehrhahn: Crystal texture mapping by energy dispersive x-ray diffraction, Z. Metallkunde 85 (1994), p. 581-584
3. A.H. Fischer and R.A. Schwarzer: Mapping of local residual strain with an x-ray scanning apparatus, Materials Science Forum, this volume, p. 673-677
4. A..H. Fischer, D. Weirauch and R.A. Schwarzer: Peltier-cooled solid state drift-chamber detector for energy dispersive x-ray pole figure measurement and texture mapping, Materials Science Forum, this volume, p. 263-269
5. F. Springer, A.H. Fischer and N.J. Park, to be published