Reverse recovery and avalanche injection in high voltage SiC PIN diodes

Materials Science Forum

Volumn 264-268, Issue PART 2, 1998, Pages 1041-1044

  Domeij, M ^a   Breitholtz, B ^a,b   Linnros, J ^a   Ostling M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b ABB CORPORATE RESEARCH   (Sweden)

Author keywords

Avalanche Injection; Impact Ionization; Reverse Recovery; Turn Off Failure

Indexed keywords

CURRENT DENSITY; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC POWER MEASUREMENT; FAILURE ANALYSIS; IONIZATION OF SOLIDS; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SILICON CARBIDE;

TURN OFF ELECTRIC FAILURE;

SEMICONDUCTOR DIODES;

EID: 0031652178     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.264-268.1041     Document Type: Article

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