High-field fast-risetime pulse failures in 4H- and 6H-SiC pn junction diodes

Journal of Applied Physics

Volumn 80, Issue 2, 1996, Pages 1219-1225

  Neudeck, Philip G ^a   Fazi, Christian ^b  

^a NASA GLENN RESEARCH CENTER   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000566595     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362922     Document Type: Article

References (22)

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