Turn-off failure of IGBTs under clamped inductive load

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 2, Issue , 1998, Pages 1191-1195

  Trivedi, Malay ^a   Shenai, Krishna ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INSULATED GATE BIPOLAR TRANSISTORS;

COMPUTER SIMULATION; ELECTRIC FAULT CURRENTS; ELECTRIC LOADS; SEMICONDUCTOR JUNCTIONS;

BIPOLAR TRANSISTORS;

EID: 0031642358     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. IGBT Designer's Manual, International Rectifier, 1994
2. H. Hagino, J. Yamashita, A. Uenishi, and H. Hamguchi, "An experimental and numerical study on the forward biased SOA of IGBTs, " IEEE Trans. Electron Devices, 43(3), pp. 490-500, 1996
3. M. Trivedi and K. Shenai, "Investigation of the short-circuit performance of IGBT, " IEEE Trans. Electron Devices, 45(1), pp. 313-320, 1998
4. ATHENA Users Manual, Silvaco International, Santa Clara, CA
5. ATLAS Users Manual, Silvaco International, Santa Clara, CA
6. M. Trivedi and K. Shenai, "IGBT dynamics for short-circuit and clamped inductive switching, " Proc. IEEE Appl. Power Elec. Conf., 1998