IGBT dynamics for short-circuit and clamped inductive switching

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn 2, Issue , 1998, Pages 743-748

  Trivedi, Malay ^a   Shenai, Krishna ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; GATES (TRANSISTOR); SHORT CIRCUIT CURRENTS; THERMAL STRESS;

CLAMPED INDUCTIVE SWITCHING STRESS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

BIPOLAR TRANSISTORS;

EID: 0031706385     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)