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Volumn Part F133492, Issue , 1998, Pages 353-361

Process modeling for sequential build-up of multi-layered structures

Author keywords

[No Author keywords available]

Indexed keywords

NETWORK COMPONENTS; PROCESS ENGINEERING; DEFORMATION; MATHEMATICAL MODELS; RESIDUAL STRESSES; STRESS ANALYSIS; SUBSTRATES;

EID: 0031630758     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678718     Document Type: Conference Paper
Times cited : (13)

References (9)
  • 1
    • 0026868979 scopus 로고
    • Modeling of multilevel structures: A general method of analyzing stress evolution during processing
    • Cifuentes, A. O., I. A. Shareef, 1992, "Modeling of Multilevel Structures: A General Method of Analyzing Stress Evolution during Processing, " IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 2, pp. 128-137.
    • (1992) IEEE Transactions on Semiconductor Manufacturing , vol.5 , Issue.2 , pp. 128-137
    • Cifuentes, A.O.1    Shareef, I.A.2
  • 2
    • 0027840050 scopus 로고
    • Some modeling issues on the finite element computation of thermal stresses in metal lines
    • Cifuentes, A. O., I. A. Shareef, 1993, "Some Modeling Issues on the Finite Element Computation of Thermal Stresses in Metal Lines, " Journal of Electronic Packaging, Transactions of the ASME, vol. 115, pp. 392-403.
    • (1993) Journal of Electronic Packaging, Transactions of the ASME , vol.115 , pp. 392-403
    • Cifuentes, A.O.1    Shareef, I.A.2
  • 3
    • 5844401360 scopus 로고    scopus 로고
    • Thermo-mechanical behavior of High-density Interconnect Vias
    • Proceedings of INTERPACK June 97
    • Dunne, R., Smith, K., S. Sitaraman, 1997a, "Thermo-mechanical behavior of High-density Interconnect Vias, " Advances in Electronic Packaging, Vol. 2, Proceedings of INTERPACK June 97, pp. 1305-1311.
    • (1997) Advances in Electronic Packaging , vol.2 , pp. 1305-1311
    • Dunne, R.1    Smith, K.2    Sitaraman, S.3
  • 4
    • 0031235704 scopus 로고    scopus 로고
    • Warpage and interfacial stress distribution in a single-level-integrated-module (SLIM)
    • Dunne R., S. Sitaraman, 1997b, "Warpage and Interfacial Stress Distribution in a Single-Level-Integrated-Module (SLIM), " Journal of Electronic Packaging, Transactions of the ASME, vol. 119, pp. 197-203.
    • (1997) Journal of Electronic Packaging, Transactions of the ASME , vol.119 , pp. 197-203
    • Dunne, R.1    Sitaraman, S.2
  • 5
    • 0026377583 scopus 로고
    • Thermal stresses in layered electrical assemblies bonded with solder
    • Morgan, H. S., 1995, "Thermal Stresses in Layered Electrical Assemblies Bonded with Solder, " Journal of Electronic Packaging, Transactions of the ASME, Vol. 113, pp. 350-354.
    • (1995) Journal of Electronic Packaging, Transactions of the ASME , vol.113 , pp. 350-354
    • Morgan, H.S.1
  • 9
    • 0029327969 scopus 로고
    • Interfacial thermal stresses in layered structures: The stepped edge problem
    • Yin, W-L, 1995, "Interfacial Thermal Stresses in Layered Structures: The Stepped Edge Problem, " Journal of Electronic Packaging, Transactions of the ASME, Vol. 117, pp. 153-157.
    • (1995) Journal of Electronic Packaging, Transactions of the ASME , vol.117 , pp. 153-157
    • Yin, W.-L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.