Epitaxial lead titanate grown by MBE

Journal of Crystal Growth

Volumn 174, Issue 1-4, 1997, Pages 473-479

  Theis, C D ^a   Schlom, D G ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Epitaxy; MBE; PbTiO3

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMIC SPECTROSCOPY; CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; LANTHANUM COMPOUNDS; MOLECULAR BEAM EPITAXY; PROCESS CONTROL; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; THIN FILMS; X RAY CRYSTALLOGRAPHY;

ATOMIC ABSORPTION (AA) SPECTROSCOPY; ATOMIC LAYER BY LAYER COMPOSITION CONTROL; LANTHANUM ALUMINATE; LEAD TITANATE;

LEAD COMPOUNDS;

EID: 0031547278     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)01144-X     Document Type: Article

References (41)

1. J.F. Scott and C. Paz de Araujo, Science 246 (1989) 1400.
2. A. Seifert, F.F. Lange and J.S. Speck, J. Mater. Res. 10 (1995) 680.
3. K. Iijima, I. Ueda and K. Kugimiya, Jpn. J. Appl. Phys. 30 (1991) 2149.
4. Y.-F. Chen, T. Yu, J.-X. Chen, L. Shun, P. Li and N.-B. Ming, Appl. Phys. Lett. 66 (1995) 148.
5. Y. Gao, G. Bai, K.L. Merkle, Y. Shi, H.L.M. Chang, Z. Shen and D.J. Lam, J. Mater. Res, 8 (1993) 145.
6. G.R. Bai, H.L.M. Chang, C.M. Foster, Z. Shen and D.J. Lam, J. Mater. Res. 9 (1994) 156.
7. C.M. Foster, Z. Li, M. Buckett, D. Miller, P.M. Baldo, L.E. Rehn, G.R. Bai, D. Guo, H. You and K.L. Merkle, J. Appl. Phys. 78 (1995) 2607.
8. H. Tabata, O. Murata, T. Kawai, S. Kawai and M. Okuyama, Appl. Phys. Lett. 64 (1994) 428.
9. W.-Y. Hsu and R. Raj, Appl. Phys. Lett 67 (1995) 792.
10. C.D. Theis and D.G. Schlom, in: Epitaxial Oxide Thin Films II, Eds. D.K. Fork, J.S. Speck, R.M. Wolf and T. Shiosaki, Mater. Res. Soc. Symp. Proc., Vol. 401 (Mater. Res. Soc., Pittsburgh, 1996) pp. 171-176.
11. K. Iijima, Y. Tomita, R. Takayama and I. Ueda, J. Appl. Phys. 60 (1986) 361.
12. E.C. Subbarao, Ferroelectrics 5 (1973) 267.
13. C.H. Ahn, J.-M. Triscone, N. Archibald, M. Decroux, R.H. Hammond, T.H. Geballe, O. Fischer and M.R. Beasley, Science 269 (1995) 373.
14. J.F. Scott, C. Paz de Araujo and G.W. Taylor, Eds., Ferroelectric Thin Films: Synthesis and Basic Properties (Gordon and Breach, New York, 1996).
15. K.-H. Hellwege, Ed., Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, New Series III, Vol. 7b1 (Springer, Berlin, 1975) pp. 26-27.
16. K.-H. Hellwege, Ed., Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, New Series III, Vol. 3 (Springer, Berlin, 1969) p. 59.
17. K.-H. Hellwege, Ed., Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, New Series III, Vol. 14a (Springer, Berlin, 1988) p. 30.
18. J.W. Dalziel and A.J.E. Welch, Acta Cryst. 13 (1960) 956.
19. K.-H. Hellwege, Ed., Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, New Series III, Vol. 7e (Springer, Berlin, 1976) p. 134.
20. D. Taylor, Trans. J. Brit Cer. Soc. 84 (1985) 181.
21. C.D. Theis and D. G. Schlom, J. Mater. Res., in press.
22. R.E. Honig and D.A. Kramer, RCA Rev. 30 (1969) 285.
23. R.H. Lamoreaux, D.L. Hildenbrand and L. Brewer, J. Phys. Chem. Ref. Data 16 (1987) 419.
24. R.L. Holman, Ferroelectrics 14 (1976) 675.
25. S. Shirasaki, Solid State Commun. 9 (1971) 1217.
26. J.P. Remeika, J. Am. Chem. Soc. 76 (1954) 940.
27. J.P. Remeika and A.M. Glass, Mater. Res. Bull. 5 (1970) 37.
28. M.A. Eisa, M.F. Abadir and A.M. Gadalla, Trans. J. Brit. Ceram. Soc. 79 (1980) 100.
29. C.D. Theis, Investigation of Growth and Domain Structure of Epitaxial Lead Titanate Thin Films, MS Thesis, The Pennsylvania State University, University Park, PA (1996).
30. D.G. Schlom and J.S. Harris, Jr., in: Molecular Beam Epitaxy: Applications to Key Materials, Ed. R.F.C. Farrow (Noyes, Park Ridge, 1995).
31. R.A. Betts and C.W. Pitt, Electron. Lett. 21 (1985) 960; M. Petrucci, C.W. Pitt and P.J. Dobson, Electron. Lett. 22 (1986) 954.
32. R.A. Betts and C.W. Pitt, Electron. Lett. 21 (1985) 960; M. Petrucci, C.W. Pitt and P.J. Dobson, Electron. Lett. 22 (1986) 954.
33. R.A. McKee, F.J. Walker, J.R. Conner, E.D. Specht and D.E. Zelmon, Appl. Phys. Lett. 59 (1991) 782.
34. C. Lu and Y. Guan, J. Vac. Sci. Technol. A 13 (1995) 1797.
35. Intelligent Sensor Technology, Mountain View, CA.
36. WeckTech Systems, Pleasanton, CA.
37. EPI, Chorus Corp., St. Paul, MN.
38. Haynes is a registered trademark of Haynes International, Kokomo, IN.
39. Ti-Ball is a registered trademark of Varian Vacuum Products, Lexington, MA.
40. C.D. Theis and D.G. Schlom, J. Vac. Sci. Technol. A 14 (1996) 2677.
41. M. de Keijser and G.J.M. Dormans, Mater. Res. Soc. Bull. 21 (1996) 37.