메뉴 건너뛰기




Volumn 15, Issue 4, 1997, Pages 2418-2425

Recombination at the silicon nitride/silicon interface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0031476154     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580757     Document Type: Article
Times cited : (44)

References (43)
  • 2
    • 0345044258 scopus 로고
    • edited by A. B. Bibyk, V. J. Kapoor, and N. S. Alvi The Electrochemical Society, Pennington, NJ
    • E. H. Nicolian, in Silicon Nitride and Silicon Dioxide Thin Insulating Films, edited by A. B. Bibyk, V. J. Kapoor, and N. S. Alvi (The Electrochemical Society, Pennington, NJ, 1989), p. 177.
    • (1989) Silicon Nitride and Silicon Dioxide Thin Insulating Films , pp. 177
    • Nicolian, E.H.1
  • 42
    • 85033182852 scopus 로고    scopus 로고
    • L. C. Olsen, JPL Contract No. 956614 (1986)
    • L. C. Olsen, JPL Contract No. 956614 (1986).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.