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Volumn 3347, Issue , 1997, Pages 326-337

Cryo-analytical electron microscopy: New insight into the understanding of crystalline and electronic structure of silver halides

Author keywords

AEM (EFTEM EELS; EDX STEM SEM); Image analysis; Silver halides

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY DISPERSIVE SPECTROSCOPY; EXCITONS; IMAGE ANALYSIS; LIGHT REFLECTION; PERMITTIVITY; PHOTOGRAPHIC EMULSIONS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS;

EID: 0031390143     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.301428     Document Type: Conference Paper
Times cited : (1)

References (12)
  • 4
    • 0029708503 scopus 로고    scopus 로고
    • Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques
    • The IS&T,. Springfield, USA
    • (1996) Proc. IS & T49th Ann. Conf. , pp. 46-50
    • Oleshko, V.1    Gijbels, R.2    Jacob, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.