Combined characterization of silver halide photographic systems and their components by conventional and energy-filtering TEM/EELS, STEM/EDX, SEM, and image analysis techniques

Proceedings of the IS&T Annual Conference

Volumn , Issue , 1996, Pages 46-50

  Oleshiko, V P ^a   Gijbels, R H ^a   Jacob, W A ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; MORPHOLOGY; PHOTOGRAPHIC EMULSIONS; PHOTOGRAPHIC FILMS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SILVER COMPOUNDS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY FILTERING; PHOTOGRAPHIC SYSTEMS; POLYHEDRAL CLUSTERS; SILVER HALIDE; TABULAR GRAINS;

LIGHT SENSITIVE MATERIALS;

EID: 0029708503     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)